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Measurement and Modeling of Silicon Heterostructure Devices von Cressler, John D. (eBook)

  • Erscheinungsdatum: 12.12.2010
  • Verlag: Taylor and Francis
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Measurement and Modeling of Silicon Heterostructure Devices

When you see a nicely presented set of data, the natural response is: ",How did they do that, what tricks did they use, and how can I do that for myself?", Alas, usually, you must simply keep wondering, since such tricks-of- the-trade are usually held close to the vest and rarely divulged. Shamefully ignored in the technical literature, measurement and modeling of high-speed semiconductor devices is a fine art. Robust measuring and modeling at the levels of performance found in modern SiGe devices requires extreme dexterity in the laboratory to obtain reliable data, and then a valid model to fit that data. Drawn from the comprehensive and well-reviewed Silicon Heterostructure Handbook, this volume focuses on measurement and modeling of high-speed silicon heterostructure devices. The chapter authors provide experience-based tricks-of-the-trade and the subtle nuances of measuring and modeling advanced devices, making this an important reference for the semiconductor industry. It includes easy-to-reference appendices covering topics such as the properties of silicon and germanium, the generalized Moll-Ross relations, the integral charge-control model, and sample SiGe HBT compact model parameters.

Produktinformationen

    Format: PDF
    Kopierschutz: AdobeDRM
    Erscheinungsdatum: 12.12.2010
    Sprache: Englisch
    ISBN: 9781420066937
    Verlag: Taylor and Francis
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